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[ 特殊顯微鏡設備 | Wafer Probing | 簡易經濟型 4 "用 ]

Analytical Probe Station/4點探針/探針量測儀
MINI Probe Station 4"/簡易經濟型4"用

 
Model:PE-4

 

Features

Compact Size

Light Weight

Price Affordable

Electro-Optics Application

Light Intensity / Wave Length

Measurement for LED / LD / PD

RF Probing East / West

University Lab. Suitable

Ideal for small wafer less than 4"

Side-Driven Chuck Stage

Backlash-Free Movement

Specifications

Vacuum Chuck

4" Stainless Steel

Chuck Stage

3" x3" Travel

Chuck Theta

0~30 degree

Platen

6 Micropositioner

Requirements

Electrical

110 VAC, 60Hz

Vacuum

-250 mmHg, 7 liter/min

Dimensions

320mmW x 320mmD x 400mmH With Microscope

Weight 20 Kg  With Microscope

Accessories

Chuck Stage Push to Position

Chuck Stage Vacuum-Based Movement

Microscope Tilting Mechanism
And Quick Right Angle Switchover

Light Intemsity / Wave Length

Measurment Adapter

RF Probe / Cables

Active Probes

Low Current / Capacitance Probes

High Voltage Probe

Ultrasonic Cutter

CCTV System

Photomicrographics

Packaged Device Holder

PCB Holder

Thermal Systems

Liquid Crystal Kit

Vibration Free TableTOP

Shielding Box

Test Bench

Instrument Case With Caster

Chuck Vacuum Pattern

Gold Plated Chuck

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update: 2012-05-08